Marcin Mosinski, Daniel Noack, Falk Stefan Pappert, Oliver Rose, Wolfgang Scholl. Cluster based analytical method for the lot delivery forecast in semiconductor fab with wide product range. In S. Jain, Roy R. Creasey Jr., Jan Himmelspach, K. Preston White, Michael C. Fu, editors, Winter Simulation Conference 2011, WSC'11, Phoenix, AZ, USA, December 11-14, 2011. pages 1834-1844, WSC, 2011. [doi]
Abstract is missing.