Fusaomi Nagata, Kenta Tokuno, Keigo Watanabe, Maki K. Habib. Design Application of Deep Convolutional Neural Network for Vision-Based Defect Inspection. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2018, Miyazaki, Japan, October 7-10, 2018. pages 1705-1710, IEEE, 2018. [doi]
Abstract is missing.