Suriya Natarajan, Amitava Majumdar, Jeyavijayan Rajendran. Hot topic session 9C: Test and fault tolerance for emerging memory technologies. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1, IEEE, 2014. [doi]
Abstract is missing.