Jongho Park, Sangjun Lee, Inhwan Lee, Sungwhan Park, Sungho Kang. Correlation Aware Random Pattern Generation for Test Time and Shift Power Reduction of Logic BIST. In 19th International SoC Design Conference, ISOCC 2022, Gangneung-si, Republic of Korea, October 19-22, 2022. pages 53-54, IEEE, 2022. [doi]
Abstract is missing.