Edge-Resolved Transient Imaging: Performance Analyses, Optimizations, and Simulations

Charles Saunders, William Krska, Julián Tachella, Sheila W. Seidel, Joshua Rapp, John Murray-Bruce, Yoann Altmann, Stephen McLaughlin, Vivek K. Goyal. Edge-Resolved Transient Imaging: Performance Analyses, Optimizations, and Simulations. In 2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021. pages 2858-2862, IEEE, 2021. [doi]

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