Power Characterization of Embedded SRAMs for Power Binning

Yang Zhao, Lisa Grenier, Amitava Majumdar. Power Characterization of Embedded SRAMs for Power Binning. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 203-208, IEEE, 2012. [doi]

Abstract

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