Current status and future prospects of SiC power JFETs and ICs

Jian H. Zhao, Kuang Sheng, Yongxi Zhang, Ming Su

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

This paper will review the development of SiC power devices especially SiC power junction field-effect transistors (JFETs). Rationale and different approaches to the development of SiC power JFETs will be presented, focusing on normally-OFF power JFETs that can provide the highly desired fail-save feature for reliable power switching applications. New results for the first demonstration of SiC Power ICs will be presented and the potential for distributed DC-DC power converters at frequencies higher than 35 MHz will be discussed.

Original languageEnglish (US)
Pages (from-to)1031-1041
Number of pages11
JournalIEICE Transactions on Electronics
VolumeE91-C
Issue number7
DOIs
StatePublished - Jul 2008

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Keywords

  • High temperature electronics
  • Junction field-effect transistor (JFET)
  • Normally off
  • Power integrated circuits
  • Silicon carbide (SiC)

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