Sheng-Jer Kuo, Chung-Len Lee, Soon-Jyh Chang, Jwu E. Chen. A DFT for semi-DC fault diagnosis for switched-capacitor circuits. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 58-63, IEEE Computer Society, 1999. [doi]
Abstract is missing.